TY  - GEN
AU  - Wang, Laung-Terng [ed.]
AU  - Stroud, Charles E. [ed.]
AU  - Touba, Nur A. [ed.]
TI  - System on chip test architectures: Nanometer design for testability
SN  - 9780123739735
U1  - 621.395 
PY  - 2008///
CY  - Amsterdam
PB  - Elsevier
KW  - System on a chip -- Testing
KW  - Integrated circuits -- Very large scale integration -- Testing
ER  -