TY  - GEN
AU  - Egerton, R. F.
TI  - Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM [2nd ed.]
SN  - 9783319398761
U1  - 502.825 
PY  - 2016///
CY  - Switzerland
PB  - Springer
KW  - Electron microscopy
ER  -