TY  - BOOK
AU  - Lannoo,M.
AU  - Bourgoin,J.
TI  - Point defects in semiconductors I: theoretical aspects
SN  - 0387105182 (U.S. : v. 1)
U1  - 537.622 
PY  - 1981///
CY  - Berlin
PB  - Springer-Verlag
KW  - Semiconductors
KW  - Defects
ER  -