TY  - GEN
AU  - Schroder, Dieter K.
TI  - Semiconductor material and device characterization
SN  - 9780471739067
U1  - 621.381 
PY  - 2006///
CY  - New Jersey
PB  - John Wiley
KW  - Semiconductors
KW  - Semiconductors -- Testing
KW  - Electronics -- Solid state
KW  -  Electronics -- Semiconductors
ER  -