000 00475pam a2200169a 44500
008 160408b1973 xxu||||| |||| 00| 0 eng d
082 _a548.8
_bH34a
100 _aHead, A. K.
245 1 _aCOMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION
260 _aAmsterdam
_bNorth-Holand
_c1973
300 _a400
440 _aDefects In Crystalline Solids
_vV. 7
500 _aReferences : P.387-389
650 _aSolidification
964 _gCIRC
997 _aA33033 C
999 _c260985
_d260985