000 00426pam a2200145a 44500
008 160408b1975 xxu||||| |||| 00| 0 eng d
082 _a001.64044028
_bB387
100 _aBenwell, Nicholas
245 1 _aBECHMARKING COMPUTER EVALUATION AND MEASUREMENT
260 _aNew York
_bJohn Wiley
_c1975
300 _a190
650 _aElectric Digital Computers -- Evaluation -- Congresses
964 _gCIRC
997 _aA47875 C
999 _c265352
_d265352