000 00420pam a2200157a 44500
008 160408b1970 xxu||||| |||| 00| 0 eng d
082 _a669.950282
_bT574
100 _aTolansky, S.
245 1 _aMULTIPLE-BEAM INTERFERENCE MICROSCOPY OF METALS
260 _aLondon
_bAcademic Press
_c1970
300 _a147
650 _aInterference Microscope
650 _aMetallography
964 _gCIRC
997 _aA28184 C
999 _c266065
_d266065