000 00366pam a2200145a 44500
008 160408b1978 xxu||||| |||| 00| 0 eng d
010 _a77013269
020 _a0 306 35728 3
082 _a530.4
_bM214M
100 _aThomas, J.P.
245 1 _aMATERIAL CHARACTERIZATION USING ION BEAMS
260 _a
_bPlenum Press
_c1978
964 _gCIRC
997 _aA56016 C
999 _c279675
_d279675