000 00468pam a2200157a 44500
008 160408b1987 xxu||||| |||| 00| 0 eng d
082 _a621.38173
_bH649i
100 _aHnatek, Eugene R.
245 1 _aINTEGRATED CIRCUITS QUALITY AND RELIABILITY
260 _aNew York
_bMarcel Dekker
_c1987
300 _axiii,698
440 _aElectrical Engineering And Electronics
_v41
650 _aIntegrated Circuits -- Reliability
964 _gCIRC
997 _aA98717 s C
999 _c283354
_d283354