| 000 | 00488pam a2200157a 44500 | ||
|---|---|---|---|
| 008 | 160408b1987 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_a621.38173 _bT789L |
||
| 100 | _aTsui, Frank F. | ||
| 245 | 1 | _aLSI/VLSI TESTABILITY DESIGN | |
| 260 |
_aNew York _bMcgraw-Hill _c1987 |
||
| 300 | _axv,702 | ||
| 650 | _aIntegrated Circuits -- Large Scale Integration -- Testing | ||
| 650 | _aIntegrated Circuits -- Very Large Scale Integration -- Testing | ||
| 964 | _gCIRC | ||
| 997 | _aA97602 s C | ||
| 999 |
_c305886 _d305886 |
||