000 00488pam a2200157a 44500
008 160408b1987 xxu||||| |||| 00| 0 eng d
082 _a621.38173
_bT789L
100 _aTsui, Frank F.
245 1 _aLSI/VLSI TESTABILITY DESIGN
260 _aNew York
_bMcgraw-Hill
_c1987
300 _axv,702
650 _aIntegrated Circuits -- Large Scale Integration -- Testing
650 _aIntegrated Circuits -- Very Large Scale Integration -- Testing
964 _gCIRC
997 _aA97602 s C
999 _c305886
_d305886