000 00618pam a2200205a 44500
008 160408bc1992 xxu||||| |||| 00| 0 eng d
020 _a0792391888
082 _a621.395
_bG346s
100 _aGhosh, Abhijit
245 1 _aSEQUENTIAL LOGIC TESTING AND VERIFICATION
260 _aBoston
_bKluwer Academic Pub.
_cc1992
300 _axv,214
440 _aKluwer International Series In Engineering And Computer Science
_vSecs 163
650 _aLogic Circuits -- Testing
650 _aLogic Design
650 _aCopmuter Aided Design
700 _aNewton, A. Richard
964 _gCIRC
997 _aA113981 s C
999 _c317198
_d317198