000 00611pam a2200193a 44500
008 160408b2003 xxu||||| |||| 00| 0 eng d
020 _a0819441104
082 _a620.1123
_bST34D
100 _aSteinchen,Wolfgang
245 1 _aDIGITAL SHEROGRAPHY
_cTHEORY AND APPLICATION OF DIGITAL SPECKLE PATTERN SHEARING INTERFEROMETRY
260 _a
_bSpie-The International Soc. For Optical Engg., Washington
_c2003
300 _axvii,310
650 _aHolographic Interferometry
650 _aSpeckle
650 _aNon-Destructive Testing
700 _aYang,Lianxiang
964 _gCIRC
997 _aA145511 S C
999 _c327090
_d327090