| 000 | 00548pam a2200205a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20250526101954.0 | ||
| 008 | 160408bc1990 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0471511048 | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 082 |
_a621.38152 _bSch75s |
||
| 100 | _aSchroder, Dieter K. | ||
| 245 | 1 |
_aSemiconductor material and device characterization _cDieter K. Schroder |
|
| 260 |
_aNew York _bJohn Wiley _c1990 |
||
| 300 | _axv, 599p | ||
| 650 | _aSemiconductors | ||
| 650 | _aSemiconductors -- Testing | ||
| 942 | _cTXT | ||
| 999 |
_c327563 _d327563 |
||