000 | 00579pam a2200193a 44500 | ||
---|---|---|---|
008 | 160408b1999 xxu||||| |||| 00| 0 eng d | ||
020 | _a3540643710 | ||
082 |
_a621.38152 _bK868P |
||
100 | _aKrause-Rehberg,R. | ||
245 | 1 |
_aPOSITRON ANNIHILATION IN SEMICONDUCTORS _cDEFECT STUDIES |
|
260 |
_a _bSpringer-Verlag, Berlin _c1999 |
||
300 | _axv,378 | ||
440 |
_aSpringer Series In Solid-State Sciences _v |
||
500 | _aIncludes Bibliographical References And Index | ||
650 | _aSemiconductors | ||
700 | _aLeipner,H. S. | ||
964 | _gCIRC | ||
997 | _aA129621 s C | ||
999 |
_c330304 _d330304 |