| 000 | 00666pam a2200193a 44500 | ||
|---|---|---|---|
| 008 | 160408b1998 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0792381076 | ||
| 082 |
_a621.381 _bK964R |
||
| 100 | _aKuo,Way, Chien,Wei-Ting Kary | ||
| 245 | 1 |
_aRELIABILITY, YIELD, AND STRESS BURN-IN _cUNIFIED APPROACH FOR MICROELECTRONICS SYSTEMS MANUFACTURING & SOFTWARE DEVELOPMENT |
|
| 260 |
_a _bKluwer Academic Publishers,Boston _c1998 |
||
| 300 | _axxvi,394 | ||
| 650 | _aIntegrated Circuits--Design And Construction | ||
| 650 | _aMicroelectronics--Reliability | ||
| 650 | _aComputer Software--Development | ||
| 700 | _aKim,Taeho | ||
| 964 | _gCIRC | ||
| 997 | _aA126385 s C | ||
| 999 |
_c331225 _d331225 |
||