000 | 00456pam a2200169a 44500 | ||
---|---|---|---|
008 | 160408b2000 xxu||||| |||| 00| 0 eng d | ||
020 | _a0471319317 | ||
082 |
_a621.381548 _bM866P |
||
100 | _aMourad,Samiha | ||
245 | 1 | _aPRINCIPLES OF TESTING ELECTRONIC SYSTEMS | |
260 |
_a _bJohn Wiley, New York _c2000 |
||
300 | _axix,420 | ||
650 | _aElectronic Circuits -- Testing | ||
700 | _aZorian,Yervant | ||
964 | _gCIRC | ||
997 | _aA132598 s C | ||
999 |
_c337170 _d337170 |