000 00456pam a2200169a 44500
008 160408b2000 xxu||||| |||| 00| 0 eng d
020 _a0471319317
082 _a621.381548
_bM866P
100 _aMourad,Samiha
245 1 _aPRINCIPLES OF TESTING ELECTRONIC SYSTEMS
260 _a
_bJohn Wiley, New York
_c2000
300 _axix,420
650 _aElectronic Circuits -- Testing
700 _aZorian,Yervant
964 _gCIRC
997 _aA132598 s C
999 _c337170
_d337170