| 000 | 00521pam a2200169a 44500 | ||
|---|---|---|---|
| 008 | 160408b2002 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0471205060 | ||
| 082 |
_a670.427 _bG192M |
||
| 100 | _aGarrett,Patrick H. | ||
| 245 | 1 |
_aMULTISENSOR INSTRUMENTATION 6 DESIGN _cDEFINED ACCURACY COMPUTER-INTEGRATED MEASUREMENT SYSTEMS |
|
| 260 |
_a _bJohn Wiley, New York _c2002 |
||
| 300 | _ax,213 | ||
| 500 | _aWith Cd-Rom | ||
| 650 | _aElectrooptical Devices -- Testing -- Congress | ||
| 964 | _gCIRC | ||
| 997 | _aA141053 C | ||
| 999 |
_c341503 _d341503 |
||