000			00562pam a2200181a 44500
008			160408b2003 xxu||||| |||| 00| 0 eng d
020			_a140207235X
082			_a621.3950287 _bN545P
100			_aNicolici,Nicola
245	1		_aPOWER-CONSTRAINED TESTING OF VLSI CIRCUITS
260			_a _bKluwer Academic Publishers, Boston _c2003
300			_ax,178
650			_aIntegrated Circuits, Very Large Scale Integration -- Testing
650			_aSemiconductors -- Thermal Properties
700			_aAl-Hashimi,Bashir M
964			_gCIRC
997			_aA148129 s s C
999			_c347980 _d347980