| 000 | 00660pam a2200229a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20250406020003.0 | ||
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780470027844 | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 082 |
_a620.11299 _bB734m2 |
||
| 100 | _aBrandon, David | ||
| 245 |
_aMicrostructural characterization of materials [2nd ed.] _cDavid Brandon and Wayne D. Kaplan |
||
| 250 | _a2nd ed. | ||
| 260 |
_aChichester _bJohn Wiley & Sons _c2008 |
||
| 300 | _axiv, 536p | ||
| 440 | _aQuantitative software engineering series | ||
| 650 | _aMaterials -- Microscopy | ||
| 700 | _aKaplan, Wayne d. | ||
| 942 |
_cBK _01 |
||
| 999 |
_c362203 _d362203 |
||