| 000 | 00688pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9781402083624 | ||
| 040 | _aIIT, Kanpur | ||
| 082 |
_a621.38152 _bP289c |
||
| 100 | _aPavlov, Andrei | ||
| 245 | 1 |
_aCMOS SRAM circuit design and parametric test in nano-scaled technologies _bprocess-aware SRAM design and test _cAndrei Pavlov and Manoj Sachdev |
|
| 260 |
_aNew York _bSpringer _c2008 |
||
| 300 | _axvi, 193p | ||
| 440 |
_aFrontiers In Electronic Testing / Edited By Vishwani D. Agrawal _vV.40 |
||
| 650 | _aMetaloxide semiconductors, complementary | ||
| 700 | _aSachdev, Manoj | ||
| 997 | _aA165755 C | ||
| 999 |
_c364246 _d364246 |
||