| 000 | 00668pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780863417450 | ||
| 040 | _aIIT, Kanpur | ||
| 082 |
_a621.38150287 _bT286 |
||
| 100 | _a | ||
| 245 | 1 |
_aTest and diagnosis of analogue, mixed-signal and RF integrated circuits _bthe system on chip approach _cedited by Yichuang Sun |
|
| 260 |
_aLondon _bThe Institution Of Engineering And Technology _c2008 |
||
| 300 | _axx, 389p | ||
| 440 |
_aCircuits, Devices And Systems Series _vNo. 19 |
||
| 650 | _aLinear integrated circuits -- Testing | ||
| 700 | _aSun,Yichuang, Ed | ||
| 997 | _aA166155 s C | ||
| 999 |
_c364683 _d364683 |
||