000 | 00712pam a2200193a 44500 | ||
---|---|---|---|
008 | 160408b2003 xxu||||| |||| 00| 0 eng d | ||
020 | _a9783642024160 | ||
040 | _aIIT, Kanpur | ||
082 |
_a621.381548 _bB74l2 |
||
100 | _aBreitenstein, O. | ||
245 | 0 |
_aLock-in thermography _bbasics and use for evaluating electronic devices and materials _cO. Breitenstein, W. Warta and M. Langenkamp |
|
250 | _a2nd | ||
260 |
_aBerlin _bSpringer _c2003 |
||
300 | _ax, 255p | ||
440 |
_aSpringer Series In Advanced Microelectronics / Edited By K. Itoh _vNo.10 |
||
650 | _aElectronic apparatus and applications -- Thermal properties | ||
700 | _aWarta, W. | ||
997 | _aA173070 s C | ||
999 |
_c369852 _d369852 |