| 000 | 00641pam a2200205a 44500 | ||
|---|---|---|---|
| 008 | 160408b2012 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9783642225659 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a502.825 _bK299 |
||
| 245 | 0 |
_aKelvin probe force microscopy _bmeasuring and compensating electrostatic forces _cedited by Sascha Sadewasser and Thilo Glatzel |
|
| 260 |
_aBerlin _bSpringer _c2012 |
||
| 300 | _axiv, 331p. | ||
| 440 | _aSpringer series in surface sciences | ||
| 490 | _aedited By G. Ertl | ||
| 650 | _aAtomic force microscopy | ||
| 700 | _aSadewasser, Sascha, ed. | ||
| 700 | _aGlatzel, Thilo, ed. | ||
| 942 | _cBK | ||
| 999 |
_c370647 _d370647 |
||