| 000 | 00739pam a2200217a 44500 | ||
|---|---|---|---|
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780387764863 | ||
| 040 | _aP K Kelkar Library, IIT Kanpur | ||
| 082 |
_a621.381548 _bT233n |
||
| 100 | _aTehranipoor, Mohammad | ||
| 245 | 0 |
_aNanometer technology designs high-quality delay tests _cMohammad Tehranipoor and Nisar Ahmed |
|
| 260 |
_aNew York _bSpringer _c2008 |
||
| 300 | _axvii, 281p | ||
| 650 | _aNanotechnology | ||
| 650 | _aIntegrated circuits--Testing | ||
| 650 | _aIntegrated circuits--Very large scale integration | ||
| 650 | _aComputer engineeringComputer-aided design | ||
| 650 | _aSystems engineering | ||
| 700 | _aAhmed, Nisar | ||
| 997 | _aA177610 s C | ||
| 999 |
_c373778 _d373778 |
||