| 000 | 00655pam a2200193a 44500 | ||
|---|---|---|---|
| 008 | 160408b2014 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9783527411528 | ||
| 040 | _aP K Kelkar Library, IIT Kanpur | ||
| 082 |
_a535.470287 _bSe69f |
||
| 100 | _aServin, Manuel | ||
| 245 | 0 |
_aFringe pattern analysis for optical metrology _btheory, algorithms, and applications _cManuel Servin, J. Antonio Quiroga and J. Moises Padilla |
|
| 260 |
_aGermany _bWiley-Vch _c2014 |
||
| 300 | _axvi, 327p | ||
| 650 | _aOptical measurements | ||
| 650 | _aDiffraction patterns | ||
| 650 | _aInterferometry | ||
| 700 | _aQuiroga, J. Antonio | ||
| 997 | _aA180207 C | ||
| 999 |
_c376009 _d376009 |
||