000			00466pam a2200145a 44500
082			_a621.3817 _bSch95i
100			_aSchwartz, Seymour
245	1		_aINTEGRATED CIRCUITS TECHNOLOGY _cINSTRUMENTATION AND TECHNIQUES FOR MEASUREMENT, PROCESS AND FAILURE ANALYSIS
260			_aNew York _bMcgraw-Hill _cc1967
300			_a340
500			_aIncludes Bibliographies
650			_aMicroelectronics -- Addresses, Essays, Lectures
964			_gCIRC
997			_aK12427 C
999			_c389177 _d389177