| 000 | 00540pam a2200169a 44500 | ||
|---|---|---|---|
| 082 |
_aGOI-DAE _bIGC-246/2003 |
||
| 100 | _aKrishnaiah,M V,Asuvathraman,R | ||
| 245 | 1 | _aMICRO-CONTROLLER BASED SEMI-AUTOMATIC DATA ACQUISITION SYSTEM FOR THE SIEMENS D500 X-RAY DIFFRACTOMETER | |
| 260 |
_a _bIndira Gandhi Centre For Atomic Research, Kalpakkam _c2003 |
||
| 300 | _av,24 | ||
| 440 |
_aIndira Gandhi Centre _v |
||
| 650 | _aAutomation | ||
| 650 | _aX-Ray Diffraction | ||
| 700 | _aParthasarathi,R | ||
| 964 | _gCIRC | ||
| 997 | _aTR20635 C | ||
| 999 |
_c404128 _d404128 |
||