000			00803 aa a2200229 a 4500
005			20170508152213.0
008			170508b xxu||||| |||| 00| 0 eng d
020			_a9780123739735
040			_cIITK
041			_aeng
082			_a621.395 _bSy87
245	1		_aSystem on chip test architectures _bNanometer design for testability _cedited by Laung-Terng wang, Charles E. Stroud and Nur A. Touba
260			_aAmsterdam _bElsevier _c2008
300			_axix, 856p
440			_aThe Morgan Kaufmann series in systems on silicon / edited by Wayne Wolf
650			_aSystem on a chip -- Testing
650			_aIntegrated circuits -- Very large scale integration -- Testing
700			_aWang, Laung-Terng [ed.]
700			_aStroud, Charles E. [ed.]
700			_aTouba, Nur A. [ed.]
942			_cBK
999			_c468817 _d468817