| 000 | 00659 a2200241 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20250526101757.0 | ||
| 008 | 170810b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780471739067 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a621.381 _bSch75s3 |
||
| 100 | _aSchroder, Dieter K. | ||
| 245 |
_aSemiconductor material and device characterization _cDieter K. Schroder |
||
| 250 | _a3rd ed. | ||
| 260 |
_aNew Jersey _bJohn Wiley _c2006 |
||
| 300 | _axv, 779p | ||
| 650 | _aSemiconductors | ||
| 650 | _aSemiconductors -- Testing | ||
| 650 | _aElectronics -- Solid state | ||
| 650 | _a Electronics -- Semiconductors | ||
| 942 | _cTXT | ||
| 999 |
_c557723 _d557723 |
||