| 000 | 01064 a2200181 4500 | ||
|---|---|---|---|
| 020 | _a9783527340910 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a540 _bC755 |
||
| 245 |
_aConductive atomic force microscopy _b applications in nanomaterials _cedited by Mario Lanza |
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| 260 |
_bWiley _c2017 _aWeinheim |
||
| 300 | _axix, 361p. | ||
| 505 | _aThe first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research. | ||
| 650 | _aAtomic force microscopy | ||
| 650 | _aTechnology and engineering | ||
| 700 | _aLanza, Mario [ed.] | ||
| 942 | _cBK | ||
| 999 |
_c558247 _d558247 |
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