000			01128nam a22002177a 4500
005			20250619145342.0
008			180905b xxu||||| |||| 00| 0 eng d
020			_a9783642420238
040			_cIIT Kanpur
041			_aeng
082			_a004 _bV849
245			_aVLSI design and test _cedited by Manoj Singh Gaur
260			_aBerlin _bSpringer _c2013
300			_axi, 388p
440			_aCommunications in computer and information science / edited by Simone Diniz Junqueira Barbosa
440			_ano. 382
520			_aThis book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
650			_aIntegrated circuits -- Very large scale integration -- Design and construction
700			_aGaur, Manoj Singh [ed.]
942			_cBK
999			_c559478 _d559478