000			01666 a2200253 4500
005			20181112105848.0
008			181112b xxu||||| |||| 00| 0 eng d
020			_a9783319756868
040			_cIIT Kanpur
041			_aeng
082			_a502.825 _bK299
245			_aKelvin probe force microscopy _bfrom single charge detection to device characterization _cedited by Sascha Sadewasser and Thilo Glatzel
260			_bSpringer _c2018 _aSwitzerland
300			_axxiv, 521p
440			_aSpringer series in surface sciences
490			_a/ edited by Roberto Car; v.65
520			_aThis book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
650			_aAtomic force microscopy
650			_aThermodynamics
650			_aEngineering
700			_aGlatzel, Thilo [ed.]
700			_aSadewasser, Sascha [ed.]
942			_cBK
999			_c559760 _d559760