000			01457 a2200217 4500
005			20190813120437.0
008			190805b xxu||||| |||| 00| 0 eng d
020			_a9783030136536
040			_cIIT Kanpur
041			_aeng
082			_a620.5 _bV87a2
100			_aVoigtländer, Bert
245			_aAtomic force microscopy _cBert Voigtländer
250			_a2nd ed.
260			_bSpringer _c2019 _aSwitzerland
300			_axiv, 331p
440			_aNanoscience and technology / edited by Phaedon Avouris
520			_aThis book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
650			_aAtomic force microscopy -- Technology and engineering
942			_cBK
999			_c560609 _d560609