Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS (Record no. 335357)

MARC details
000 -LEADER
fixed length control field 00683pam a2200193a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408bc1993 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 079239352X
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Item number L492H
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Leblebici,Yusuf
245 1# - TITLE STATEMENT
Title HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Kluwer Academic Publishers, Boston
Date of publication, distribution, etc. c1993
300 ## - PHYSICAL DESCRIPTION
Extent xvi,212
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal Oxide Semiconductors -- Reliability -- Mathematical Models
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Hot-Carriers -- Reliability -- Mathematical Models
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Kang,Sung-Mo (Steve)
964 ## -
-- CIRC
997 ## -
-- A132867 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Total Renewals Full call number Barcode Date last seen Date last checked out Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007 1 1 621.395 L492H A132867 13/11/2018 03/08/2018 08/04/2016 Books

Powered by Koha