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HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS

By: Contributor(s): Material type: TextTextPublication details: Kluwer Academic Publishers, Boston c1993Description: xvi,212ISBN:
  • 079239352X
Subject(s): DDC classification:
  • 621.395 L492H
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur General Stacks 621.395 L492H (Browse shelf(Opens below)) Available A132867
Total holds: 0

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