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PRINCIPLES OF TESTING ELECTRONIC SYSTEMS (Record no. 337170)

MARC details
000 -LEADER
fixed length control field 00456pam a2200169a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b2000 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0471319317
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381548
Item number M866P
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mourad,Samiha
245 1# - TITLE STATEMENT
Title PRINCIPLES OF TESTING ELECTRONIC SYSTEMS
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. John Wiley, New York
Date of publication, distribution, etc. 2000
300 ## - PHYSICAL DESCRIPTION
Extent xix,420
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electronic Circuits -- Testing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Zorian,Yervant
964 ## -
-- CIRC
997 ## -
-- A132598 s C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Uniform Resource Identifier Price effective from Koha item type
        COMPACT STORAGE (BASEMENT) PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007   621.381548 M866P A132598 08/04/2016 Book Request 08/04/2016 Books

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