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PRINCIPLES OF TESTING ELECTRONIC SYSTEMS

By: Contributor(s): Material type: TextTextPublication details: John Wiley, New York 2000Description: xix,420ISBN:
  • 0471319317
Subject(s): DDC classification:
  • 621.381548 M866P
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Holdings
Item type Current library Collection Call number URL Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur COMPACT STORAGE (BASEMENT) 621.381548 M866P (Browse shelf(Opens below)) Link to resource Available A132598
Total holds: 0

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