Physical principles of electron microscopy (Record no. 543343)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00559 a2200205 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230518113035.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 170125b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319398761 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IITK |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| Item number | Eg26p2 |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Egerton, R. F. |
| 245 ## - TITLE STATEMENT | |
| Title | Physical principles of electron microscopy |
| Remainder of title | an introduction to TEM, SEM, and AEM [2nd ed.] |
| Statement of responsibility, etc | R. F. Egerton |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Switzerland |
| Name of publisher | Springer |
| Year of publication | 2016 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xi, 196p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Electron microscopy |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| TEXT | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 23/01/2017 | 2 | 4192.00 | 502.825 Eg26p2 | A182978 | 5588.70 | Text Books |