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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM [2nd ed.]

By: Language: English Publication details: Switzerland Springer 2016Edition: 2nd edDescription: xi, 196pISBN:
  • 9783319398761
Subject(s): DDC classification:
  • 502.825 Eg26p2
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Text Books Text Books PK Kelkar Library, IIT Kanpur TEXT 502.825 Eg26p2 (Browse shelf(Opens below)) Available A182978
Total holds: 0

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