Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM [2nd ed.]
Language: English Publication details: Switzerland Springer 2016Edition: 2nd edDescription: xi, 196pISBN:- 9783319398761
- 502.825 Eg26p2
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | TEXT | 502.825 Eg26p2 (Browse shelf(Opens below)) | Available | A182978 |
Total holds: 0
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