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HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING
Material type:
TextPublication details: Boston Kluwer Academic Pub. c1990Description: x,159ISBN: - 079239058X
- 621.38173 B469h
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.38173 B469h (Browse shelf(Opens below)) | Available | A113644 |
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| 621.38171 T348 THIN FILMS | 621.38173 B179c CIRCUITS, INTERCONNECTIONS AND PACKING FOR VLSI | 621.38173 B469a ANALYSIS DESIGN AND APPLICATIONS OF FIN LINES | 621.38173 B469h HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING | 621.38173 C445a ANALYSIS AND DESIGN OF INTEGRATED ELECTRONIC CIRCUITS | 621.38173 C445a2 ANALYSIS AND DESIGN OF INTEGRATED ELECTRONIC CIRCUITS | 621.38173 C496 CIRCUIT ANALYSIS, SIMULATION AND DESIGN |
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