DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
Material type:
TextSeries: Perspectives In Computing ; V. 18Publication details: London Academic Pr. c1987Description: x,440ISBN: - 0124967533
- 621.38173 D492
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38173 D492 (Browse shelf(Opens below)) | Link to resource | Damaged (F) | A100700 |
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| 621.38173 D362p PHOTORESIST | 621.38173 D437v VLSI SIGNAL PROCESSING | 621.38173 D46 DESIGNER'S HANDBOOK OF INTEGRATED CIRCUITS | 621.38173 D492 DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING | 621.38173 D569 DIGITAL MOS INTEGRATED CIRCUITS | 621.38173 F418u ULTRA LARGE SCALE INTEGRATED MICROEL-ECTRONICS | 621.38173 F434i INTRODUCTION TO VLSI TESTING |
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