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RELIABILITY, YIELD, AND STRESS BURN-IN
Material type:
TextPublication details: Kluwer Academic Publishers,Boston 1998Description: xxvi,394ISBN: - 0792381076
- 621.381 K964R
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381 K964R (Browse shelf(Opens below)) | Link to resource | Available | A126385 |
Total holds: 0
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| 621.381 K666iE PRECISION ELECTRONICS | 621.381 K668m MASERS AND LASERS | 621.381 K66r RELIABILITY OF ANALOGUE ELECTRONIC SYSTEMS | 621.381 K964R RELIABILITY, YIELD, AND STRESS BURN-IN | 621.381 K969r RADIOASTRONOMICAL METHODS OF ANTENNA MEASUREMENTS | 621.381 L174s SOLDERING FOR ELECTRONIC ASSEMBLIES | 621.381 L457L PRINCIPLES OF ELECTRONICS INSTRUMENTATION |
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