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METAL IMPURITIES IN SILICON-DEVICE FABRICATION
Material type:
TextPublication details: Springer-Verlag, Berlin 2000Edition: 2nd revDescription: xv,268ISBN: - 3540642137
- 621.38152 G758M2
| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 G758M2 (Browse shelf(Opens below)) | Link to resource | Available | A131369 |
Total holds: 0
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No cover image available | No cover image available | No cover image available | ||
| 621.38152 G449o ORIENTED CRYSTALLIZATION ON AMORPHOUS SUBSTRACTS | 621.38152 G519 GLOW DISCHARGE OF HYDROGENATED AMORPHOUS SILICON | 621.38152 G643t TESTING SEMICONDUCTOR MEMORIES | 621.38152 G758M2 METAL IMPURITIES IN SILICON-DEVICE FABRICATION | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES |
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