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POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
Material type:
TextPublication details: Kluwer Academic Publishers, Boston 2003Description: x,178ISBN: - 140207235X
- 621.3950287 N545P
| Item type | Current library | Collection | Call number | URL | Copy number | Status | Date due | Barcode | Item holds | |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3950287 N545P (Browse shelf(Opens below)) | Link to resource | s | Available | A148129 |
Total holds: 0
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| 621.395015113 R299 REPRESENTATIONS OF DISCRETE FUNCTIONS | 621.395028 B24l Logic synthesis for compositional microprogram control units | 621.3950287 C42E EFFICIENT BRANCH AND BOUND SEARCH WITH APPLICATION TO COMPUTER-AIDED DESIGN | 621.3950287 N545P POWER-CONSTRAINED TESTING OF VLSI CIRCUITS | 621.396 Ot8e ELECTRIC FURNACES | 621.396 Ot8e ELECTRIC FURNACES | 621.396 P865p Practical R. F. heating for the wood industry |
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