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ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
Material type:
TextPublication details: Kluwer Academic / Plenum Publishers,New York 1986Description: xii,454ISBN: - 0306421402
- 502.825 AD95
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 AD95 (Browse shelf(Opens below)) | Available | A157250 |
Total holds: 0
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| 502.82 W950m Microscope image processing | 502.82 X79 X-ray microscopy and spectromicroscopy | 502.825 Ab37 Aberration-corrected analytical transmission electron microscopy | 502.825 AD95 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY |
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