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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
Material type:
TextSeries: Frontiers In Electronic Testing / Edited By Vishwani D. Agrawal ; V.40Publication details: New York Springer 2008Description: xvi, 193pISBN: - 9781402083624
- 621.38152 P289c
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.38152 P289c (Browse shelf(Opens below)) | Available | A165755 |
Total holds: 0
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| 621.38152 Or8e The electrical characterization of semiconductors | 621.38152 P194 Optical processes in semiconductors | 621.38152 P275u UNDERSTANDING SEMICONDUCTOR DEVICES | 621.38152 P289c CMOS SRAM circuit design and parametric test in nano-scaled technologies | 621.38152 P566 Photonic crystals | 621.38152 P695 PLASMA DEPOSITION OF AMORPHOUS SILICON-BASED MATERIALS | 621.38152 P871 Power/HVMOS devices compact modeling |
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