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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

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Contributor(s): Material type: TextTextSeries: Circuits, Devices And Systems Series ; No. 19Publication details: London The Institution Of Engineering And Technology 2008Description: xx, 389pISBN:
  • 9780863417450
Subject(s): DDC classification:
  • 621.38150287 T286
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