Image from Amazon.com
System on chip test architectures : Nanometer design for testability
Material type:
ArticleLanguage: English Series: The Morgan Kaufmann series in systems on silicon / edited by Wayne WolfPublication details: Amsterdam Elsevier 2008Description: xix, 856pISBN: - 9780123739735
- 621.395 Sy87
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 621.395 Sy87 (Browse shelf(Opens below)) | Available | A161217 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur shelves, Collection: General Stacks Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 621.395 SA75I AN INTRODUCTION TO VLSI PHYSICAL DESIGN | 621.395 Se23v VLSI PLACEMENT & GLOBAL ROUTING USING SIMULATED ANNEALING | 621.395 Si58f FPGA design | 621.395 Sy87 System on chip test architectures | 621.395 T194F FUNDAMENTALS OF MODERN VLSI DEVICES | 621.395 T194F FUNDAMENTALS OF MODERN VLSI DEVICES | 621.395 V19V VLSI DESIGN |
There are no comments on this title.
Log in to your account to post a comment.