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COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION

548.8 / H34a
Head, A. K.
COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION / .- Amsterdam: North-Holand, 1973 .- 400 . .- ( Defects In Crystalline Solids V. 7
References : P.387-389
Subject Headings:
Solidification;
Copy Details:
Acc. No.: A33033, Full Call No.: 548.8 H34a, Item type: Books , Location: General Stacks,
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COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION