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COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION (Record no. 260985)

MARC details
000 -LEADER
fixed length control field 00475pam a2200169a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b1973 xxu||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 548.8
Item number H34a
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Head, A. K.
245 1# - TITLE STATEMENT
Title COMPUTED ELECTRON MICROGRAPHS AND DEFECT IDENTIFICATION
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Amsterdam
Name of publisher, distributor, etc. North-Holand
Date of publication, distribution, etc. 1973
300 ## - PHYSICAL DESCRIPTION
Extent 400
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Defects In Crystalline Solids
Volume/sequential designation V. 7
500 ## - GENERAL NOTE
General note References : P.387-389
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Solidification
964 ## -
-- CIRC
997 ## -
-- A33033 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Date last checked out Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 12/08/2007 1 548.8 H34a A33033 12/02/2018 07/09/2017 08/04/2016 Books

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